Exploring the Accuracy of Machine Learning Models in Predicting Toxic Leadership: A Case Study in the IT Industry (No Full text)
Date
2024
Journal Title
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Volume Title
Publisher
Institute of Electrical and Electronics Engineers Inc.
Abstract
Description
item.page.type
Conference Paper
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Keywords
Deep Learning, IT sector, Logistic Regression, Machine learning, Neural Networks, Random Forest, Toxic Leadership
Citation
R. Alami, T. A. Masaeid and A. Stachowicz-Stanusch, "Exploring the Accuracy of Machine Learning Models in Predicting Toxic Leadership: A Case Study in the IT Industry," 2024 2nd International Conference on Cyber Resilience (ICCR), Dubai, United Arab Emirates, 2024, pp. 1-5, doi: 10.1109/ICCR61006.2024.10532955.