Exploring the Accuracy of Machine Learning Models in Predicting Toxic Leadership: A Case Study in the IT Industry (No Full text)

Date

2024

Journal Title

Journal ISSN

Volume Title

Publisher

Institute of Electrical and Electronics Engineers Inc.

Abstract

Description

Keywords

Deep Learning, IT sector, Logistic Regression, Machine learning, Neural Networks, Random Forest, Toxic Leadership

Citation

R. Alami, T. A. Masaeid and A. Stachowicz-Stanusch, "Exploring the Accuracy of Machine Learning Models in Predicting Toxic Leadership: A Case Study in the IT Industry," 2024 2nd International Conference on Cyber Resilience (ICCR), Dubai, United Arab Emirates, 2024, pp. 1-5, doi: 10.1109/ICCR61006.2024.10532955.

DOI